"A simple and effective compression scheme for test pins reduction."

Marie-Lise Flottes, Regis Poirier, Bruno Rouzeyre (2002)

Details and statistics

DOI: 10.1109/HLDVT.2002.1224447

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics