"An AOI system development for inspecting defects on 6 surfaces of chips."

Ming-Fu Chen et al. (2016)

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DOI: 10.1109/I2MTC.2016.7520525

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Ming-Fu Chen, Chih-Wen Chen, Chih-Yen Chen, Chi-Hung Hwang, Liang-Yin Hwang:
An AOI system development for inspecting defects on 6 surfaces of chips. I2MTC 2016: 1-6

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