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"Eliminating Re-Burn-In in semiconductor manufacturing through statistical ..."
Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola (2017)
- Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola:
Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. I2MTC 2017: 1-6
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