"Metal Surface Defect Detection System Based on Semiconductor Laser and ..."

Zhijie Zhang et al. (2019)

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DOI: 10.1109/I2MTC.2019.8826839

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-18

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Zhijie Zhang, Ningchen Dong, Chenyang Zhao, Wuliang Yin:
Metal Surface Defect Detection System Based on Semiconductor Laser and Infrared Thermal Imaging. I2MTC 2019: 1-5

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