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"Deep Learning-Based SBOM Defect Detection for Medical Devices."

Heeyeon Kim, Ki-Hyung Kim (2024)

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DOI: 10.1109/ICAIIC60209.2024.10463483

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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Heeyeon Kim, Ki-Hyung Kim:
Deep Learning-Based SBOM Defect Detection for Medical Devices. ICAIIC 2024: 47-51

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