"Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of ..."

Matthew Repasky, Xiuyuan Cheng, Yao Xie (2024)

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DOI: 10.1109/ICASSP48485.2024.10445927

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type: Conference or Workshop Paper

metadata version: 2024-10-06

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Matthew Repasky, Xiuyuan Cheng, Yao Xie:
Stage-Regularized Neural Stein Critics For Testing Goodness-Of-Fit Of Generative Models. ICASSP 2024: 7255-7259

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