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"Feedback-Guided Circuit Structure Mutation for Testing Hardware Model ..."

Chengyu Zhang et al. (2021)

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DOI: 10.1109/ICCAD51958.2021.9643509

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Chengyu Zhang, Minquan Sun, Jianwen Li, Ting Su, Geguang Pu:
Feedback-Guided Circuit Structure Mutation for Testing Hardware Model Checkers. ICCAD 2021: 1-9

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