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ORCID"A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in ..."
Kohei Miyase et al. (2009)
- Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara:
A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD 2009: 97-104
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