"Variability analysis of FinFET-based devices and circuits considering ..."

Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee (2009)

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DOI: 10.1145/1687399.1687495

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee:
Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization. ICCAD 2009: 505-512

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