"Work-function variation induced fluctuation in ..."

Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee (2010)

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DOI: 10.1109/ICCAD.2010.5654260

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee:
Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design. ICCAD 2010: 714-720

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