"A new method to improve accuracy of leakage current estimation for ..."

Kuen-Yu Tsai et al. (2008)

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DOI: 10.1109/ICCAD.2008.4681587

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng:
A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. ICCAD 2008: 286-291

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