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"Machine Learning-Based Test Pattern Generation for Neuromorphic Chips."

Hsiao-Yin Tseng et al. (2021)

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DOI: 10.1109/ICCAD51958.2021.9643459

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/iccad/TsengCWL21
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  - https://dblp.org/rec/conf/iccad/TsengCWL21
Hsiao-Yin Tseng, I-Wei Chiu, Mu-Ting Wu, James Chien-Mo Li:
Machine Learning-Based Test Pattern Generation for Neuromorphic Chips. ICCAD 2021: 1-7

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