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ORCID"An Area-Efficient Scannable In Situ Timing Error Detection Technique ..."
Hao Zhang et al. (2021)
- Hao Zhang, Weifeng He, Yanan Sun, Mingoo Seok:
An Area-Efficient Scannable In Situ Timing Error Detection Technique Featuring Low Test Overhead for Resilient Circuits. ICCAD 2021: 1-9
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