"Fault-based alternate test of RF components."

Selim Sermet Akbay, Abhijit Chatterjee (2007)

Details and statistics

DOI: 10.1109/ICCD.2007.4601947

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics