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"A testable PLA design with low overhead and ease of test generation."

Jing-Yang Jou (1988)

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DOI: 10.1109/ICCD.1988.25741

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Jing-Yang Jou:
A testable PLA design with low overhead and ease of test generation. ICCD 1988: 450-453

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