"An efficient reliability simulation flow for evaluating the hot carrier ..."

Mehdi Kamal et al. (2012)

> Home

Details and statistics

DOI: 10.1109/ICCD.2012.6378663

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccd/KamalXPAS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/KamalXPAS12
Mehdi Kamal, Qing Xie, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari:
An efficient reliability simulation flow for evaluating the hot carrier injection effect in CMOS VLSI circuits. ICCD 2012: 352-357

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.