"Automatic Testing Environment for Virtual Network Embedded Systems."

Takeru Kuroiwa, Yusuke Aoyama, Noriyuki Kushiro (2020)

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DOI: 10.1109/ICCE46568.2020.9043099

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-30

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Takeru Kuroiwa, Yusuke Aoyama, Noriyuki Kushiro:
Automatic Testing Environment for Virtual Network Embedded Systems. ICCE 2020: 1-3

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