"Linear regression techniques for efficient analysis of transistor variability."

Dimitrios Stamoulis et al. (2014)

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DOI: 10.1109/ICECS.2014.7049973

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Dimitrios Stamoulis, Dimitrios Rodopoulos, Brett H. Meyer, Dimitrios Soudris, Zeljko Zilic:
Linear regression techniques for efficient analysis of transistor variability. ICECS 2014: 267-270

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