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"All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using ..."

Takamoto Watanabe (2021)

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DOI: 10.1109/ICECS53924.2021.9665569

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-14

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Takamoto Watanabe:
All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS. ICECS 2021: 1-4

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