"Using Negative Correlation to Evolve Fault-Tolerant Circuits."

Thorsten Schnier, Xin Yao (2003)

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DOI: 10.1007/3-540-36553-2_4

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Thorsten Schnier, Xin Yao:
Using Negative Correlation to Evolve Fault-Tolerant Circuits. ICES 2003: 35-46

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