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"Accelerated reliability testing of flash memory: Accuracy and issues on a ..."

Marcello Calabrese et al. (2013)

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DOI: 10.1109/ICICDT.2013.6563298

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Marcello Calabrese, Carmine Miccoli, Christian Monzio Compagnoni, Luca Chiavarone, Silvia Beltrami, Andrea Parisi, Sebastiano Bartolone, Andrea L. Lacaita, Alessandro S. Spinelli, Angelo Visconti:
Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology. ICICDT 2013: 37-40

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