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"Impacts of single trap induced random telegraph noise on Si and Ge ..."
Shao-Yu Yang et al. (2013)
- Shao-Yu Yang, Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang:
Impacts of single trap induced random telegraph noise on Si and Ge nanowire FETs, 6T SRAM cells and logic circuits. ICICDT 2013: 61-64
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