"Voltage step stress: a technique for reducing test time of device ageing."

Jian Fu Zhang et al. (2019)

Details and statistics

DOI: 10.1109/ICICDT.2019.8790938

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics