"Is overfeat useful for image-based surface defect classification tasks?"

Pei-Hung Chen, Shen-Shyang Ho (2016)

> Home

Details and statistics

DOI: 10.1109/ICIP.2016.7532457

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icip/ChenH16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icip/ChenH16
Pei-Hung Chen, Shen-Shyang Ho:
Is overfeat useful for image-based surface defect classification tasks? ICIP 2016: 749-753

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.