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"Nanometer resolution dynamic displacement measurement in industrial/high ..."

Tim John Joseph, Venkataraman Kartik (2016)

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DOI: 10.1109/ICIT.2016.7474830

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Tim John Joseph, Venkataraman Kartik:
Nanometer resolution dynamic displacement measurement in industrial/high noise environments. ICIT 2016: 673-678

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