"Single Event Effects as a Reliability Issue of IT Infrastructure."

Eishi Ibe et al. (2005)

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DOI: 10.1109/ICITA.2005.254

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Eishi Ibe, Hideaki Kameyama, Yasuo Yahagi, Hironaru Yamaguchi:
Single Event Effects as a Reliability Issue of IT Infrastructure. ICITA (1) 2005: 555-560

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