"Design of Optimal Bayesian Reliability Test Plans for a Parallel System ..."

P. N. Bajeel, Mahesh Kumar (2020)

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DOI: 10.1007/978-981-15-8061-1_39

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-17

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P. N. Bajeel, Mahesh Kumar:
Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring. ICMC 2020: 483-490

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