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"A New Semi-Supervised Deep Learning Approach for Intelligent Defects ..."

Yiping Gao, Liang Gao, Xinyu Li (2020)

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DOI: 10.1109/ICNSC48988.2020.9238100

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-24

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  dblp key:
  - conf/icnsc/GaoG020
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  - https://dblp.org/rec/conf/icnsc/GaoG020
Yiping Gao, Liang Gao, Xinyu Li:
A New Semi-Supervised Deep Learning Approach for Intelligent Defects Recognition. ICNSC 2020: 1-4

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