"6th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2021, ..."

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DOI: 10.1109/MET52542.2021

access: closed

type: Editorship

metadata version: 2021-08-03

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  - https://dblp.org/rec/conf/icse-met/2021
6th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2021, Madrid, Spain, June 2, 2021. IEEE 2021, ISBN 978-1-6654-4464-4 [contents]

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