"Test Case Reduction Based on the Join Condition in Pairwise Coverage-Based ..."

Yuper Lay Myint et al. (2018)

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DOI: 10.1109/ICSTW.2018.00055

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type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yuper Lay Myint, Hironori Washizaki, Yoshiaki Fukazawa, Hideyuki Kanuka, Hiroki Ohbayashi:
Test Case Reduction Based on the Join Condition in Pairwise Coverage-Based Database Testing. ICST Workshops 2018: 239-243

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