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"An Empirical Study on the Use of Defect Prediction for Test Case ..."

David Paterson et al. (2019)

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DOI: 10.1109/ICST.2019.00041

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-04

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David Paterson, José Campos, Rui Abreu, Gregory M. Kapfhammer, Gordon Fraser, Phil McMinn:
An Empirical Study on the Use of Defect Prediction for Test Case Prioritization. ICST 2019: 346-357

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