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"Handloom Silk Fabric Defect Detection Using First Order Statistical ..."

M. E. Paramasivam, R. S. Sabeenian (2010)

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DOI: 10.1007/978-3-642-15766-0_77

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/ict/ParamasivamS10
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M. E. Paramasivam, R. S. Sabeenian:
Handloom Silk Fabric Defect Detection Using First Order Statistical Features on a NIOS II Processor. ICT 2010: 475-477

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