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"A New Method to Extract Mobility Degradation and Parasitic Series ..."

Zixuan Yang et al. (2021)

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DOI: 10.1109/ICTA53157.2021.9661623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-06

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  dblp key:
  - conf/icta3/YangXHZ021
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  - https://dblp.org/rec/conf/icta3/YangXHZ021
Zixuan Yang, Qian Xie, Qiao He, Meng Zhao, Zheng Wang:
A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs. ICTA 2021: 99-100

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