"Current crowding as a major cause for InGaN LED degradation at extreme ..."

Nicola Trivellin et al. (2021)

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DOI: 10.1109/IECON48115.2021.9589926

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-04

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Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini:
Current crowding as a major cause for InGaN LED degradation at extreme high current density. IECON 2021: 1-6

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