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"Object Depth Estimation From Line-Scan EMI Data Using Machine Learning."

Marko Simic, Davorin Ambrus, Vedran Bilas (2022)

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DOI: 10.1109/SENSORS52175.2022.9967098

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-13

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  dblp key:
  - conf/ieeesensors/SimicAB22
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  - https://dblp.org/rec/conf/ieeesensors/SimicAB22
Marko Simic, Davorin Ambrus, Vedran Bilas:
Object Depth Estimation From Line-Scan EMI Data Using Machine Learning. IEEE SENSORS 2022: 1-4

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