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"A heuristic algorithm for substrates testing in MCM."

Keisuke Murakami (2011)

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DOI: 10.1109/IEEM.2011.6117891

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Keisuke Murakami:
A heuristic algorithm for substrates testing in MCM. IEEM 2011: 121-125

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