"Analysis of Statistical Sampling in Microarchitecture Simulation: Metric, ..."

Sreekumar V. Kodakara et al. (2007)

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DOI: 10.1109/IISWC.2007.4362190

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Sreekumar V. Kodakara, Jinpyo Kim, David J. Lilja, Wei-Chung Hsu, Pen-Chung Yew:
Analysis of Statistical Sampling in Microarchitecture Simulation: Metric, Methodology and Program Characterization. IISWC 2007: 139-148

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