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"Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), ..."

Saurabh V. Suryavanshi et al. (2022)

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DOI: 10.1109/IMW52921.2022.9779251

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

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  dblp key:
  - conf/imw2/SuryavanshiYIHR22
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Saurabh V. Suryavanshi, Greg Yeric, Max Irby, X. M. Henry Huang, Glen Rosendale, Lucian Shifren:
Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology. IMW 2022: 1-4

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