"Reliability issues in RRAM ternary memories affected by variability and ..."

Antonio Rubio, Manuel Escudero, Peyman Pouyan (2017)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2017.8046238

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iolts/RubioEP17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/RubioEP17
Antonio Rubio, Manuel Escudero, Peyman Pouyan:
Reliability issues in RRAM ternary memories affected by variability and aging mechanisms. IOLTS 2017: 90-92

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.