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"On the analysis of wavelet-based approaches for print grain artifacts."

Ahmed H. Eid, Brian E. Cooper, Edward E. Rippetoe (2013)

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DOI: 10.1117/12.2000378

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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  dblp key:
  - conf/iqsp/EidCR13
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Ahmed H. Eid, Brian E. Cooper, Edward E. Rippetoe:
On the analysis of wavelet-based approaches for print grain artifacts. IQSP 2013: 86530K

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