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"First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent ..."

Ansh et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129173

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-31

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  dblp key:
  - conf/irps/AnshSKS20
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  persistent URL:
  - https://dblp.org/rec/conf/irps/AnshSKS20
Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava:
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. IRPS 2020: 1-4

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