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"Specific aspects regarding evaluation of power cycling tests with SiC devices."

Martina Gerlach, Peter Seidel, Josef Lutz (2020)

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DOI: 10.1109/IRPS45951.2020.9129128

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/irps/GerlachSL20
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  - https://dblp.org/rec/conf/irps/GerlachSL20
Martina Gerlach, Peter Seidel, Josef Lutz:
Specific aspects regarding evaluation of power cycling tests with SiC devices. IRPS 2020: 1-6

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