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"Traps Based Reliability Barrier on Performance and Revealing Early Ageing ..."

Aniket Gupta et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405185

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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  dblp key:
  - conf/irps/GuptaBSBPBAC21
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  - https://dblp.org/rec/conf/irps/GuptaBSBPBAC21
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan:
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021: 1-6

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