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"Reliability of STT-MRAM for various embedded applications."

Shinhee Han et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405094

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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  dblp key:
  - conf/irps/HanLSNJOHJLLSHJ21
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  persistent URL:
  - https://dblp.org/rec/conf/irps/HanLSNJOHJLLSHJ21
Shinhee Han, Junghyuk Lee, Kiseok Suh, Kyungtae Nam, Daeeun Jeong, Sechung Oh, Sohee Hwang, Yongsung Ji, Kilho Lee, Kangho Lee, Yoonjong Song, Yeongki Hong, Gitae Jeong:
Reliability of STT-MRAM for various embedded applications. IRPS 2021: 1-5

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