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"A Pulsed RTN Transient Measurement Technique: Demonstration on the ..."

E. R. Hsieh et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128893

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung:
A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory. IRPS 2020: 1-4

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