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"Statistical Modeling of Time-Dependent Post-Programming Conductance Drift ..."

Ruofei Hu et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529356

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/HuTXJLMLGQW24
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Ruofei Hu, Jianshi Tang, Yue Xi, Zhixing Jiang, Yuyao Lu, Chengxiang Ma, Junchen Li, Bin Gao, He Qian, Huaqiang Wu:
Statistical Modeling of Time-Dependent Post-Programming Conductance Drift in Analog RRAM. IRPS 2024: 1-6

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