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"Polysilicon resistor stability under voltage stress for safe-operating ..."
Chris Kendrick et al. (2018)
- Chris Kendrick, Michael Cook, Jeff P. Gambino, T. Myers, J. Slezak, T. Hirano, T. Sano, Y. Watanabe, K. Ozeki:
Polysilicon resistor stability under voltage stress for safe-operating area characterization. IRPS 2018: 4-1
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