"Polysilicon resistor stability under voltage stress for safe-operating ..."

Chris Kendrick et al. (2018)

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DOI: 10.1109/IRPS.2018.8353686

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-20

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Chris Kendrick, Michael Cook, Jeff P. Gambino, T. Myers, J. Slezak, T. Hirano, T. Sano, Y. Watanabe, K. Ozeki:
Polysilicon resistor stability under voltage stress for safe-operating area characterization. IRPS 2018: 4-1

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