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"Mechanisms of electromigration under AC and pulsed-DC stress in Cu/low-k ..."
M. H. Lin, A. S. Oates (2015)
- M. H. Lin, A. S. Oates:
Mechanisms of electromigration under AC and pulsed-DC stress in Cu/low-k dual damascene interconnects. IRPS 2015: 2
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