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"Fast chip aging prediction by product-like VMIN drift characterization on ..."

S. E. Liu et al. (2018)

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DOI: 10.1109/IRPS.2018.8353569

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-19

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  - conf/irps/LiuCCYKFTLFL18
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  - https://dblp.org/rec/conf/irps/LiuCCYKFTLFL18
S. E. Liu, G. Y. Chen, M. K. Chen, David Yen, W. A. Kuo, C. S. Fu, Y. S. Tsai, M. Z. Lin, Y. H. Fang, M. J. Lin:
Fast chip aging prediction by product-like VMIN drift characterization on test structures. IRPS 2018: 3

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